STM and JESDAF respectively. A typical Human Body Model circuit is presented in Figure 1. Figure 1: Typical Human Body Model Circuit. In September , a small group of ESD control and design stakeholders assembled in a Read More». In the EERC Resource Center. A Dash of Maxwell’s. JESDAF. – IEC (C= pF). – MIL method Pulse parameters. HBM. Reference voltage. 2KV 4KV. Peak current. A A.
|Published (Last):||18 November 2009|
|PDF File Size:||20.80 Mb|
|ePub File Size:||15.43 Mb|
|Price:||Free* [*Free Regsitration Required]|
Finer voltage steps may optionally be used to obtain a more accurate measure of the failure threshold. The measured voltage and the time that it is present on the device can then be compared to the known reliability mechanisms of the technology, such as time dependent dielectric breakdown TDDBto determine if a reliability concern is posed by the HBM tester.
All pins one at time to Gnd1 power pin group 2. It is recommended that the manufacturers supply the worst-case pin data with each DUT board. All pins one at time to Vdd1 power pin group 5.
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM) | JEDEC
Follow the procedure in step 3. Included pins connected to charge pump capacitors as power pins.
If the Supply pins are connected on package plane clause 4. It is recommended that the manufacturers supply the worst-case pin data with each DUT board. Machine repeatability should be verified during initial equipment acceptance by performing a minimum of 5 consecutive positive and a minimum of 5 consecutive negative waveforms at a voltage level in Table 2.
All comments will be collected and dispersed to the appropriate committee s. In case the waveform no longer meets the limits in Table 1, all ESD testing performed after the previous satisfactory waveform check will be considered invalid.
No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Otherwise, each power pin must be treated as a separate power pin. This tester issue was found to divert significant current away from the pins connected to Terminal B, such that the slew-rate of the current at terminal B is lower than seen at Terminal A.
Longer intervals are permitted and should be used if the devices are expected to be vulnerable to cumulative effects. In the test sequences where this power pin group is held at ground Terminal Bit is permitted to have all the pins in the group tied together and connected to Terminal B or to have only the previously selected pin s connected to Terminal B with all other pins in the group left floating.
Some advanced technologies s114f be vulnerable to these pulses resulting in an electrical overstress EOS.
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)
Requirement, clause number Test method number Clause number Fax: Due to lack of specifications for this phenomenon, the magnitude a1114f the resulting voltage rise at the stressed pin may vary significantly from tester to tester and can alter the behaviors of some ESD protection circuits. Apply a positive and negative V pulse and verify that the waveform meets the requirements defined in Table 1.
NOTE 2 To determine if a device to be tested is susceptible to damage from the trailing pulse it may be necessary to measure the voltage across the actual device during HBM testing, or a circuit similar to that in Figure 4. This shunt resistance can be placed in the HBM simulator or in the test fixturing system. The ESD test shall be performed at room temperature.
NOTE 6 S2 shall be closed at least 10 milliseconds after the pulse delivery period to ensure the DUT socket is not left in a charged state. The characteristics of this pre-pulse phenomenon depend on the conditions and the environment of the arcing associated with the HBM discharge, the parasitic capacitances of the tester, as well as the pin impedance of the device under test. Mesd22 is permitted to use a separate sample of 3 devices for each pin combination set specified in Table 2.
Some punctuation changes are not included. However, a114v another higher starting voltage level is used and the device fails, testing shall be restarted with a fresh device at the next lowest level.
ESD Tests | Reliability Technology Division | Services | OKI Engineering
Other suggestions for document improvement: This part of the slow decay shall be excluded jesd2 determining the trailing pulse magnitude. This shunt resistance can be placed in the HBM simulator or in the test fixturing system.
As an alternative to this method, it is permitted to partition the pins to be connected to terminal B into two or more subsets, such that each of these pins is a member of at least one subset. JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes.
Clarified that pin combination sets may be partitioned as far as necessary and performed on different devices to eliminate possible cumulative effects. ESD testing should begin at the lowest step in Table 1 but may begin at any level. Additionally, all personnel shall a114f system operational training and electrical safety training prior to using the equipment. If you can provide input, please complete this form and return to: Clarified that pin combination sets may be partitioned as far as necessary and performed on different devices to eliminate possible cumulative effects.
I recommend changes to the following: Verify that all parameters meet jesd222 limits specified in Table 1 and Figure 2. Any pin that is intended to supply power to another circuit on the same chip must be treated as a power pin.
The simulator must be capable of supplying pulses with the characteristics required by Figure 2 and Figure 3. The actual number of pin combination sets depends on the number of power pin groups.
Longer intervals are permitted and should be used if the devices are expected to be vulnerable to cumulative effects. The probe transformer and cable with a nominal length of 1 meter shall have a 1 GHz bandwidth, a minimum current rating of 12 amperes peak pulse-current capability and a rise time of less than one nanosecond.
Requirement, clause number Test method number Clause number The referenced clause number has proven to be: Scanning for the presence of any trailing pulse shall cover a period of at least 1 msec after the HBM pulse. When replacing only a single polarity of a given combination, the opposite polarity shall be used when adopting this reverse pin combination alternative.