JEITA EIAJ Standards (as of August in ). General System, Category and Title , Spec. No. (Test No.) Life Test, JEITA EIAJ ED/ Life TestⅠ, Steady. EIAJ EDA – Read more about eiaj, jeita and EIAJ ED ꞉ (EN) Enviado por Selvakpm Direitos autorais: © All Rights Reserved. Baixe no formato PDF ou leia online no Scribd.

Author: Jugal Mautaur
Country: Equatorial Guinea
Language: English (Spanish)
Genre: Environment
Published (Last): 21 April 2005
Pages: 419
PDF File Size: 1.70 Mb
ePub File Size: 19.55 Mb
ISBN: 687-5-37318-301-8
Downloads: 10054
Price: Free* [*Free Regsitration Required]
Uploader: Dugrel

B t1 1cycles Metod2? Climatic test methods C: For the sampling method, measuring the heated specimen is effective. As a result of the discussion, actual device or substrate daisy chain was selected for considering the specimen cost.

According to equations 12and 3acceleration factor AF of the two different conditions is given as follows: IEC Ed 2.

T is the temperature variation in the temperature cycle, V is the solder volume at the soldering joint, r is the radius of the bump, and? T greatly, and to shorten the examination time. Bond sample SMD with adhesive to a printed circuit board. This standard is specified of a bend stress of solder joint on a printed circuit board as a part of standard of a reliability test method.

However, using the modified Manson-Coffin’s law already proposed, the heat fatigue life at the soldering joint can be conveniently expressed as shown in equation 2. Therefore, there are two kinds of the copper wiring thickness of type B in the table.

Sharp threshold for ne Maximum allowable supply voltage Load: Printed circuit board This specification shows the conditions of general printed circuit board.

At present, this is not practical. This phenomenon might affect to broken strength data. Individual specifications on each test methods had been proposed in considering process, but this proposal was not realized.

Purpose of this standard This standard was being established at IEC. This standard provides a board level evaluation method of ed-470 impact against solder joint by means of duplicating the dropping impact stress in the field use condition. As a reference, Table1 shows the result of the calculation of the acceleration characteristic of both the test conditions and the typical conditions on the market.


Calculation of Useful Life Attached Paper?

Sharp-Reliability Test Standard for IC_图文_百度文库

Take care so that the surface temperature of the sample SMD does not exceed the specified temperature during mounting. Classification 1 Test preparation Appendix 1: Failure Mode Failure Mechanism: Immersion Time Remarks moisture ?? The 4 Appendixes confused the newest specification searching.

Table 2 Standard mount reliability test board layer configuration Types A, Ec-4702, and C 1st layer 2nd layer 3rd layer 4th layer Signal path layer Plane layer riaj mesh layer Plane layer or mesh layer Signal path layer 1st layer 2nd layer 3rd layer eiah layer 5th layer 6th layer Type D Signal path layer Plane layer or mesh layer Plane ed-47702 or mesh layer Plane layer or mesh layer Plane layer or mesh layer Signal path layer Note: It is not intended to obtain the assurance value of the supplied lot.

Opinion survey results on the test are outlined below. Table 2 Drop number Drop height 30 cmcm Drop number times 10, 20 times 3. The standards related to integrated circuits IC and separate volume Appendix had been published, and the standards related to discrete devices SD separate volume Appendix and separate volume Appendix had been published.

Mounting method of the device We gathered information by questionnaire on the mounting method of the device. Handling guidance for semiconductor devices. However, note that the boundary-scan test method is applicable only to the semiconductor devices corresponding to that test method. These test standards indicate the minimum levels of necessary quality and reliability to be applied to all the products of our company.


Maximum allowable supply voltage. Non-destructive recognition procedures of defects in Silicon Carbide Wafers Part 3: Environmental and endurance test methods for semiconductor devices Stress test I No part of this standards may be reproduced in any form or by any means without prior permission in writing from the publisher. It becomes free from fixing tools immediately before collision with floor plate.

Maximum rated preservation temp.

Standards Related to Reliability Test |Sanken Electric

Also the environmental and endurance test methods for semiconductor devices are becoming an important position at its development stage. The temperature at the reference point specified in the relevant specifications.

Shizuo Kunita Sanken Electric Co. The junction temperature of the specimen. Thank you for your participation!

3-3 Standards Related to Reliability Test |Sanken Electric

The radius of curvature of PCB can be shown as follows: They are to be used as the common standards of the company but the decision as whether a particular part is adopted or not is to be made by each division. B to be conducted? Therefore this kind of devices, it is very important t to evaluate the dropping impact influences by drop test. The members of this PG agreed that the measurement is at interval of some bending cycles. In conformity the relevant specifications when the specimen is cooled by forced convection.

In the case of continuous electric resistance monitoring system, daisy chain sample is mainly measured. Testing Standards for Reliability of Flash Memory. Topmin ; Minimum operating temperature Topmax ; Maximum operating temperature The hold time starts when the temperature of the specimen reaches the specified value.